HV-TEG/HV-FEG
DESCRIPTION
The HV-xEG series of high-voltage power supplies is designed to power scanning electron microscopes (SEM). Sources of the charged particle accelerator, bias and filament, PMT, scintillator and collector are integrated; a structure for field emission (Schottky cathode) with an accelerator-extractor-filament-suppressor arrangement is also possible. The charged particle accelerator source is ultra-stable with a low ripple level, output voltage from 0 to 30 kV at a current of up to 200 µA.
FEATURES
- Input power protection
- Overload and short circuit protection
- Output over/under voltage protection
- Arc protection
- Ultra-stable charged particle accelerator source
- Remote interlock interface (Interlock)
- Support for digital interfaces RS-232, RS-485, USB, Ethernet
- Production, support and service - Russian Federation
APPLICATION
- Scanning electron microscopy
- R&D
| The lineup | Accelerator output voltage, kV | Dimensions D x W x H, mm | Application |
|---|---|---|---|
| HV-TEGR | Up to 30 | 410 x 482.6 x 132.5 (3U) | Thermionic emission |
| HV-TEG | Up to 30 | 280 x 190 x 105 | Thermionic emission |
| HV-EGU | Up to 30 | 270 x 245 x 60 | Thermionic emission |
| HV-FEG | Up to 30 | 410 x 482.6 x 132.5 (3U) | Field emission |
| HV-FEG-60 | Up to 60 | 530 x 482.6 x 221.5 (5U) | Field emission |
| HV-LGM | Up to 30 | 530 x 482.6 x 43.6 (1U) | Electrostatic optics |
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